Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)
What we can offer:
- Non-destructive measurement of a wide range of layer thicknesses and material optical properties.
Possibility:
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To measure optical properties at wavelengths from 230 to 900 nm.
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To measure at different incidence angles (from 40° to 77°).
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To perform automatic multipoint measurements using a xy sample stage movement.
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To perform spectroscopic photometry measurements (transmittance and reflectance).
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To extract valuable optical information by automatic comparison, using a specialized software, of the measured data to the reference data available at big data-bases.
Interesting for (with the system):
- Material science industry, optoelectronic and optical industry, photovoltaic, semiconductors…
Cleanroom
The nanoGUNE cleanroom, dedicated to fabricate and characterize the properties of materials on the nanoscale, ia a 300m2 laboratory where the air purity is under strict supervision.
Equipment
State-of-the-art equipment, including electron and scanning-tunneling microscopes, as well as other nanofabrication and characterization tools, are managed by specialists and used by researchers from a wide variety of fields.