Electron-microscopy - Journal - Physical Review Letters
1. A. Philippi-Kobs, A. Farhadi, L. Matheis, D. Lott, A. Chuvilin and H. Oepen
Physical Review Letters 123, 137201 (2019)
Impact of Symmetry on Anisotropic Magnetoresistance in Textured Ferromagnetic Thin Films
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2. A. Suszka, O. Idigoras, E. Nikulina, A. Chuvilin and A. Berger
Physical Review Letters 109, 177205 (2012)
Crystallography-Driven Positive Exchange Bias in Co/CoO Bilayers
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3. J. C. Meyer, F. Eder, S. Kurasch, V. Skakalova, J. Kotakoski, H. J. Park, S. Roth, A. Chuvilin, S. Eyhusen, G. Benner, A. V. Krasheninnikov and U. Kaiser
Physical Review Letters 108, 196102 (2012)
Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
Copyright by the American Physical Society. This article may be downloaded for personal use only