• CIC nanoGUNE

Ultra-sensitive detection of magneto-optical signals by an ellipsometric extraction method, capable to measure even non-ferromagnetic samples.

• A tool that is capable of AC-field modulated magneto-optical ellipsometry measurements and designed to do this in an extremely sensitive manner, while using low-cost components. 
• It is a stand-alone system that does not require a high-quality laboratory environment. It achieves (sufficiently) rapid metrology data acquisition, so that it is capable of scanning entire wafers. Thus, it has the potential to be utilized under production like conditions.  
• Due to our novel methodology we are able to obtain measurements with a sensitivity in the rage of 5*10^-8 and are able to characterize ferromagnetic samples as well as non-ferromagnetic samples.
• We have demonstrated that separate information about different individual layers in a magnetic multilayer system can be obtained, even if individual layers generate only a very small fraction of the magneto-optical signal. It is furthermore possible to detect if such different layers show a synchronized or unsynchronized magnetization reversal.

• T-MOKE geometry – more suitable for applications (compact design)
• Robustness 
• Extreme sensitivity level
• Efficient false signal suppression
• Cost-effective components
• Entire surface scans possible
• No (high quality) laboratory environment needed